ИСТИНА

• Охват: Международная
• Даты проведения: 9-11 июня 2015
• Место проведения: Helsinki, Finland – Stockholm, Sweden, Finland
• Организатор:
  Aalto University
• Число участников: 48
• Число иностранных участников: 46
• Число участников из МГУ: 1
• Число докладчиков: 48
• Веб-сайт: http://physics.aalto.fi/pub/boat/
• Описание конференции:

  Topics Methods - application of first principles methods to atomistic modeling of nanoscale materials, including advanced approaches for studying excited states, and the limits of accuracy in electronic structure calculations of defects. TEM image simulations based on DFT data Simulations of EELS and ELNES spectra Advanced computational techniques for STM and AFM Simulations of STM spectra Production of defects under electron beam and minimization of the damage Progress in aberration-corrected high resolution transmission electron microscopy (AC-HRTEM) studies of carbon and other nanostructures Electron-beam-mediated engineering of nanostructures STM/AFM manipulation of nanostructures Surface chemistry at the nanoscale - particular emphasis will be placed on those systems where defects and impurities clearly dominate reactive properties. Introduction Recent progress in the transmission electron microscopy (TEM) as well as in scanning tunneling and atomic force microscopy (STM/AFM) made it possible to not only unravel the atomic structure of various systems with a resolution of better than 0.1 nm, but also carry out elemental analysis and determine the types of particular atoms in the sample. Moreover, based on spectroscopic in-situ techniques (for example, electron energy loss spectroscopy, EELS), the charge state and the bonding configuration of individual atoms and point defects in the material can be identified. The unequivocal interpretation of the experimental results can considerably benefit from the juxtaposition of the images to the results of first-principles calculations. With regard to TEM, the accuracy of the measurement is now so high that in addition to the information on the atomic configuration (that is atom positions), the detailed information on the spatial distribution of the electron density and on the electron structure of the system is required. Likewise, the microscopy knowledge on the local electronic structure of the system is extremely important for the correct interpretation of the experimental STM and AFM images and spectra. First principles simulations, and specifically density-functional theory (DFT) approaches, have provided lots of insight into the electronic structure and properties of various solids. They also considerably extended our understanding of how the STM/AFM or TEM images are formed. Besides, using DFT and time-dependent DFT molecular dynamics, one can simulate the manipulation of the nanostructures by SPM tools and the changes made to the system, e.g., production of defects under electron irradiation and their time evolution. In this workshop we are going to bring together the TEM/STM/AFM experts and computational materials scientists to discuss the progress in TEM/ STM/AFM analysis and visualization of the atomic structure of nanosystems. The workshop will be focused on various nanostructures, and will include a wide variety of substrates from graphene to complex oxides.

• Добавил в систему: Ксёнз Андрей Сергеевич

Доклады:

• 2015 Charge-transfer induced rotation of C 60 molecules on the WO2/W(110) surface (Стендовый)
• Авторы: Ksenz A., Bozhko S., Lübben O., Shvets I., Semenov V., Levchenko E., Radican K.

• 2015 DFT modeling of electronic growth of Pb nanoislands on Si(557) surfaces (Стендовый)
• Авторы: Bozhko S.I., Ionov A.M., Ksenz A.S.