![]() |
ИСТИНА |
Войти в систему Регистрация |
ФНКЦ РР |
||
In the present work authors studied the morphology of chitosan and silver-containing chitosan-based films by means of scanning electron microscopy and atomic force microscopy (AFM). The latter was chosen for the non-distractive nature of AFM studies, which is especially important for biopolymers that can readily degrade in contact with electron beam.