ИСТИНА

The nonlinear transmittance of synthesized glassy thin films of GexSe1-x (x from 0.15 to 0.25) with a thickness of 300 to 1100 nm was investigated using the z-scan technique with nanosecond pulsed YAG: Nd3+-laser at a wavelength of 532 nm during their movement along the z axis of a focused laser beam with simultaneous recording of the intensities of incident, transmitted and scattered laser radiation. The thickness of the films was determined using the spectroscopic ellipsometry method. The findings were used to determine the nonlinear optical coefficients of the synthesized films.