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Quantification of modifiers in advanced materials based on zinc oxide by total reflection X-ray fluorescence and inductively coupled plasma mass spectrometryстатья
Статья опубликована в высокорейтинговом журнале
Информация о цитировании статьи получена из
Web of Science,
Scopus
Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 10 мая 2016 г.
- Авторы: Filatova Daria G., Alov Nikolai V., Vorobyeva Natalia A., Rumyantseva Marina N., Sharanov Pavel Yu, Seregina Irina F., Gaskov Alexander M.
- Журнал: Spectrochimica Acta - Part B: Atomic Spectroscopy
- Том: 118
- Год издания: 2016
- Издательство: Elsevier BV
- Местоположение издательства: Netherlands
- Первая страница: 62
- Последняя страница: 65
- DOI: 10.1016/j.sab.2016.02.008
- Аннотация: A novel approach to quantification of Ga and Zn modifiers in advanced materials based on zinc oxide is presented. The approach includes a combination of total reflection X-ray fluorescence (TXRF) and inductively coupled plasma mass spectrometry (ICP-MS) for determination and validation of the results. It is suggested to use aqueous standards for the direct determination of elements in powder samples by TXRF with a relative standard deviation no more than sr = 0.11. The accuracy of these results was proved by ICP-MS after the sample decomposition, sr(In) = 0.05, sr(Ga) = 0.06 and sr(Zn) = 0.06. It was established that there is a possibility to determine indium above 300 ppb on the background of K-M3 line of argon.
- Добавил в систему: Филатова Дарья Геннадьевна