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Scanning tunneling spectroscopy of charge effects on semiconductor surfaces and atomic clustersстатья
Информация о цитировании статьи получена из
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Статья опубликована в журнале из списка Web of Science и/или Scopus
Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
- Авторы: Maslova N.S., Oreshkin S.I., Panov V.I., Savinov S.V., Depuydt A., Van Haesendonck C.
- Журнал: JETP Letters
- Том: 67
- Номер: 2
- Год издания: 1998
- Издательство: Maik Nauka/Interperiodica Publishing
- Местоположение издательства: Russian Federation
- Первая страница: 146
- Последняя страница: 152
- DOI: 10.1134/1.567638
- Аннотация: We have used scanning tunneling microscopy and scanning tunneling spectroscopy at liquid helium temperature to study the electronic structure of in situ cleaved, (110) oriented surfaces of InAs single crystals. Both unperturbed, atomically flat areas and areas with an atomic-size defect cluster have been investigated. We show that the anomalous behavior of the local tunneling conductivity, which indicates a pronounced enhancement of the semiconductor band gap for the flat areas, is consistent with band bending induced by charges localized at the apex of the tip. Atomic-size defect clusters contain additional charges which modify the band bending; this explains the different behavior of the tunneling conductivity near the defect cluster. The experimentally observed oscillations of the tunneling conductivity near the band gap edges can be directly related to resonant tunneling through quantized surface states which appear because of the band bending. В© 1998 American Institute of Physics.
- Добавил в систему: Орешкин Сергей Иванович