Аннотация:Pattern analysis with image transform based on potential
calculation was considered. Initial gray-scale image is sliced into equidistant
levels and resulting binary image was prepared by joining of some levels to
one binary image. Binary image was transformed under assumption that
white pixels in it may be considered as electric charges or spins. Using this
assumption Ising model and Coulomb model interaction between white
pixels was used for image potential transform. The transform was calculated
using moving window. The resulting gray-scale image was again transformed
to binary image using the thresholding on 0.5 level. Further binary images
were analyzed using statistical indices (average, standard deviation,
skewness, kurtosis) and geometric signatures: area, eccentricity, Euler
number, orientation and perimeter. It was found that the most suitable
geometric signature for pattern configuration analysis of Ising potential
transform (IPT) and Coulomb potential transform (CPT) is area value.
Similarly the most suitable statistics is distance statistics between white
pixels.