Место издания:Institut für Werkstofftechnik Bremen, Germany Bremen
Первая страница:42
Последняя страница:44
Аннотация:Discrete Sources Method (DSM) has been applied to investigate polarized light scattering by
nano-dimensional line bump and line pit located at a substrate surface. These defects are modeled
in the frame of unitary mathematical model of “fictitious particle” embedded into a substrate.
Distribution of the scattered intensity at a unite hemi-sphere and collector responses
have been examined versus the bump/pit orientation