Structure and nonlinear electrical properties of Ni-Fe-Mg-O epilayersстатья
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Дата последнего поиска статьи во внешних источниках: 18 июля 2013 г.
Аннотация:NiFe2O4-based epilayers grown on MgO substrates and exhibiting S-type negative-resistance behavior were characterized by x-ray diffraction, Mossbauer spectroscopy, and electron probe x-l ay microanalysis. The current-voltage characteristics of the epilayers were measured at different temperatures in ail, water, and liquid nitrogen, and the activation energy for conduction was evaluated. The neat-surface and interfacial regions of the films were shown to differ in the nature of disordering as a result of the through-thickness variation in composition.