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Characterization of aluminium nitride nanostructures by XANES and FTIR spectroscopies with synchrotron radiationстатья
Информация о цитировании статьи получена из
Scopus
Дата последнего поиска статьи во внешних источниках: 4 июня 2021 г.
- Авторы: Balasubramanian C., Bellucci S., Cinque G., Marcelli A., Cestelli-Guidi M., Piccinini M., Popov A., Soldatov A., Onorato P.
- Сборник: 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
- Том: 1
- Глава в коллективной монографии
- Год издания: 2006
- Место издания: Boston, MA; United States
- Первая страница: 233
- Последняя страница: 238
- Аннотация: e investigated different AIN nano-systems with spectroscopical methods. Experiments were performed at the Synchrotron Radiation Facility of the Laboratori Nazionali di Frascati using both XANES (X-ray Absorption Near Edge Spectroscopy) and FTIR (Fourier Transform Infrared Spectroscopy) techniques in order to investigate materials with both interesting tribological and electronic properties. Comparisons has been performed between measurements by standard X-Ray Diffraction and X-ray absorption at the K-edge of Al, a Spectroscopy method sensitive to the local order and correlated to the local and empty density of states of these high-gap semiconductor. Correlations between XRD and XAS have been drawn since x-ray absorption reveals structural information complementary to those addressed by x-ray diffraction. Moreover, a comparison has been performed by Infrared absorption both in the mid- and in the far-IR range among different AIN forms: namely, powders, nanoparticles and nanotubes. Data clearly show changes connected with the electronic properties and the optical phonon modes of AIN nano-systems.
- Добавил в систему: Попов (Popov) Анатолий (Anatoli) Иванович