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Статьи в журналах
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- 2018 Analysis of Total Ionizing Dose effects for highly scaled CMOS devices in Low Earth Orbit
- Sajid M., Chechenin N.G., Torres F.S., Hanif M.N., Gulzari U.A., Arslan S., Khang E.U.
- в журнале Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, издательство Elsevier BV (Netherlands), том 428, с. 30-37 DOI
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- 2017 Single Event Upset rate determination for 65 nm SRAM bit-cell in LEO radiation environments
- Muhammad Sajid, Chechenin N.G., Frank Sill Torres, Usman Ali Gulzari, Muhammad Usman Butt, Zhu Ming, Khan E.U.
- в журнале Microelectronics and Reliability, издательство Elsevier BV (Netherlands), том 78, с. 11-16 DOI
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- 2015 Space radiation environment prediction for VLSI microelectronics devices onboard a LEO satellite using OMERE-TRAD software
- Sajid M., Chechenin N.G., Torres F.S., Khan E.U., Agha S.
- в журнале Advances in Space Research, издательство Pergamon Press Ltd. (United Kingdom), том 56, № 2, с. 314-324 DOI