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Статьи в журналах
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- 2007 Changes in the silicon microhardness induced by a low-intensity electron beam
- Golovin Yu I., Dmitrievskii A.A., Suchkova N.Yu, Tolotaev M.Yu
- в журнале Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, издательство Pleiades Publishing, Ltd (Road Town, United Kingdom), том 1, № 2, с. 204-206 DOI
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- 2006 Nonmonotonic variations in the concentration of the donor-and acceptor-type radiation defects in silicon irradiated with low-intensity fluxes of β particles
- Badylevich M.V., Blokhin I.V., Golovin Yu I., Dmitrievskiǐ A.A., Kartsev S.V., Suchkova N.Yu, Tolotaev M.Yu
- в журнале Semiconductors, издательство Springer (New York), том 40, № 12, с. 1375-1377 DOI