–
Статьи в журналах
-
- 2009 Contrast reversal effect in scanning electron microscopy due to charging
- Abe H., Babin S., Borisov S., Hamaguchi A., Kadowaki M., Miyano Y., Yamazaki Y.
- в журнале Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, издательство AIP Publishing (United States), том 27, с. 1039-1046
Статьи в сборниках
-
- 2008 Experiment, simulation of charging effects in SEM
- Babin S., Borisov S., Miyano Y., Abe H., Kadowaki M., Hamaguchi A., Yamazaki Y.
- в сборнике Proceedings of SPIE - The International Society for Optical Engineering, с. 692219-692219-7